Using pulsed-latch scan chains for non-destructive ASIC testing

Bernardo Rodriguez-Hall, Alfonso Chacόn-Rodríguez, Renato Rimolo-Donadio, Ronny García-Ramírez

Producción científica: Capítulo del libro/informe/acta de congreso › Contribución a la conferencia › revisión exhaustiva

Idioma original	Indefinido/desconocido
Título de la publicación alojada	2024 IEEE 42nd Central America and Panama Convention (CONCAPAN XLII)
DOI	https://doi.org/10.1109/concapan63470.2024.10933830
Estado	Publicada - 27 nov 2024

Acceder al documento

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title = "Using pulsed-latch scan chains for non-destructive ASIC testing",

author = "Bernardo Rodriguez-Hall and Alfonso Chacόn-Rodr{\'i}guez and Renato Rimolo-Donadio and Ronny Garc{\'i}a-Ram{\'i}rez",

year = "2024",

month = nov,

day = "27",

doi = "10.1109/concapan63470.2024.10933830",

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T1 - Using pulsed-latch scan chains for non-destructive ASIC testing

AU - Rodriguez-Hall, Bernardo

AU - Chacόn-Rodríguez, Alfonso

AU - Rimolo-Donadio, Renato

AU - García-Ramírez, Ronny

PY - 2024/11/27

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M3 - Contribución a la conferencia

BT - 2024 IEEE 42nd Central America and Panama Convention (CONCAPAN XLII)

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