Skip to main navigation Skip to search Skip to main content

Signal and power integrity (SPI) co-analysis for high-speed communication channels

  • Renato Rimolo-Donadio
  • , Xiaomin Duan
  • , Young H. Kwark
  • , Xiaoxiong Gu
  • , Christian W. Baks
  • , Sebastian Müller
  • , Thomas Michael Winkel
  • , Thomas Strach
  • , Lei Shan
  • , Hubert Harrer
  • , Christian Schuster

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

The modeling of multiple high-speed chip-to-chip communication links over first (IC package) and second (board) level interconnects is addressed in this paper for data rates up to 28 Gb/s with model-to-hardware correlation. The suggested methodology is based on a bottom-up hybrid approach combining semi-analytical and numerical models, which are able to simultaneously consider the signal and power integrity domains and allow the incorporation of power noise models for the time domain link simulation. The required model complexity and the design space for passive interconnects are explored by analyzing diverse via and channel configurations.

Original languageEnglish
Title of host publicationDesignCon 2013
Subtitle of host publicationWhere Chipheads Connect
Pages807-831
Number of pages25
StatePublished - 2013
Externally publishedYes
EventDesignCon 2013: Where Chipheads Connect - Santa Clara, CA, United States
Duration: 28 Jan 201331 Jan 2013

Publication series

NameDesignCon 2013: Where Chipheads Connect
Volume1

Conference

ConferenceDesignCon 2013: Where Chipheads Connect
Country/TerritoryUnited States
CitySanta Clara, CA
Period28/01/1331/01/13

Fingerprint

Dive into the research topics of 'Signal and power integrity (SPI) co-analysis for high-speed communication channels'. Together they form a unique fingerprint.

Cite this