TY - GEN
T1 - Late Breaking Results
T2 - 62nd ACM/IEEE Design Automation Conference, DAC 2025
AU - Alsharkawy, Mohamed
AU - Sönmez, Eren
AU - González-Gómez, Jeferson
AU - Nassar, Hassan
AU - Henkel, Jörg
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025/6/22
Y1 - 2025/6/22
N2 - Remote Attestation (RA) has become a valuable security service for Internet of Things (IoT) devices, as the security of these devices is often not prioritized during the manufacturing process. However, traditional RA schemes suffer from a single point of failure because they rely on a trusted verifier. To address this issue, we propose a voting-based blockchain attestation protocol that provides a reliable solution by eliminating the single point of failure through distributed verification across all nodes. In addition, it offers a traceable and immutable public history of the attestation results, which can be verified by external auditors at any time. Finally, we verify our proposed protocol on three NVIDIA Jetson embedded devices hosting up to 15 attestation nodes.
AB - Remote Attestation (RA) has become a valuable security service for Internet of Things (IoT) devices, as the security of these devices is often not prioritized during the manufacturing process. However, traditional RA schemes suffer from a single point of failure because they rely on a trusted verifier. To address this issue, we propose a voting-based blockchain attestation protocol that provides a reliable solution by eliminating the single point of failure through distributed verification across all nodes. In addition, it offers a traceable and immutable public history of the attestation results, which can be verified by external auditors at any time. Finally, we verify our proposed protocol on three NVIDIA Jetson embedded devices hosting up to 15 attestation nodes.
KW - Blockchain
KW - Decentralized Systems
KW - Embedded Devices
KW - IoT
KW - Remote Attestation
UR - http://dx.doi.org/10.1109/dac63849.2025.11132416
U2 - 10.1109/dac63849.2025.11132416
DO - 10.1109/dac63849.2025.11132416
M3 - Contribución a la conferencia
T3 - Proceedings - Design Automation Conference
BT - 2025 62nd ACM/IEEE Design Automation Conference (DAC)
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 22 June 2025 through 25 June 2025
ER -