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High-speed signaling performance of multilevel wiring on glass substrates for 2.5-D integrated circuit and optoelectronic integration

  • Xiaoxiong Gu
  • , Renato Rimolo-Donadio
  • , Russell Budd
  • , Christian W. Baks
  • , Lavanya Turlapati
  • , Christopher Jahnes
  • , Daniel M. Kuchta
  • , Clint L. Schow
  • , Frank Libsch

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

This paper reports on the evaluation of high-speed signaling performance of multilevel metallic interconnects on glass substrates. The wafer fabrication, transfer process, and passive electrical characterization of interconnects are addressed. Measurement results demonstrate less than 5 dB/cm insertion loss below 20 GHz. Moreover, 2-level wiring on glass with inter-level vias is utilized to implement 3.6-mm long transmission lines that connect high-speed transceivers and optoelectronic devices in a VCSEL-based optoelectronic fiber link. The relative performances of diverse configurations with and without wiring on glass are compared. Error-free link operation at a bit-error-rate (BER) of 10-12 is demonstrated up to 30 Gb/s with ∼3 dB sensitivity penalty for the link with glass carrier transmission lines.

Original languageEnglish
Title of host publication2013 IEEE 63rd Electronic Components and Technology Conference, ECTC 2013
Pages846-851
Number of pages6
DOIs
StatePublished - 2013
Externally publishedYes
Event2013 IEEE 63rd Electronic Components and Technology Conference, ECTC 2013 - Las Vegas, NV, United States
Duration: 28 May 201331 May 2013

Publication series

NameProceedings - Electronic Components and Technology Conference
ISSN (Print)0569-5503

Conference

Conference2013 IEEE 63rd Electronic Components and Technology Conference, ECTC 2013
Country/TerritoryUnited States
CityLas Vegas, NV
Period28/05/1331/05/13

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