Electrical interconnect design for testing of high-speed IC transceivers
- R. Rimolo-Donadio
- , C. Baks
- , B. G. Lee
- , J. H. Song
- , X. Gu
- , Y. H. Kwark
- , D. M. Kuchta
- , A. V. Rylyakov
- , C. L. Schow
- IBM
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2
Scopus
citations