TY - GEN
T1 - Analog circuit calibration with single poly non-volatile memories
AU - Hafkemeyer, Kristian M.
AU - Schott, Arthur
AU - Vega-Castillo, Paola
AU - Krautschneider, Wolfgang H.
PY - 2008
Y1 - 2008
N2 - A single poly non-volatile memory module for analog circuit calibration fabricated in a standard 350 nm CMOS process is presented. This module performs the read, program and verify operations for non-volatile storage applications. This circuitry can be used, e.g. for storing data to individually adjust sensitive device parameters of biomedical analog front ends to meet precisely the target specifications. The module can be embedded in analog or mixed signal chips based on 350 nm CMOS technology.
AB - A single poly non-volatile memory module for analog circuit calibration fabricated in a standard 350 nm CMOS process is presented. This module performs the read, program and verify operations for non-volatile storage applications. This circuitry can be used, e.g. for storing data to individually adjust sensitive device parameters of biomedical analog front ends to meet precisely the target specifications. The module can be embedded in analog or mixed signal chips based on 350 nm CMOS technology.
UR - https://www.scopus.com/pages/publications/62949129918
U2 - 10.1109/NORCHP.2008.4738322
DO - 10.1109/NORCHP.2008.4738322
M3 - Contribución a la conferencia
AN - SCOPUS:62949129918
SN - 9781424424931
T3 - Norchip - 26th Norchip Conference, Formal Proceedings
SP - 254
EP - 257
BT - Norchip - 26th Norchip Conference, Formal Proceedings
T2 - 26th Norchip Conference, Norchip
Y2 - 17 November 2008 through 18 November 2008
ER -